Novel algorithm on optical/digital invariant recognition of two-dimensional patterns with straight lines
Jae Kyung Pan, Hyun Huh · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1994
A novel opto-digital pattern recognition method which has the shift, rotation, and scale invariant properties is proposed for recognizing 2D images having straight lines. The proposed method is composed of three stages. In the first stage, the line features of the image are extracted. The second stage imposes the shift, rotation, and scale invariant properties on the extracted features through the proposed operations. In the last stage, an artificial feed forward neural network is trained with the extracted features. To evaluate the proposed algorithm, nine different binary edge enhanced images are utilized as the experimental patterns. The successful recognition results through the computer simulation and the opto-digital experiment are presented.