Improving neural network methods for time domain fault analysis of nonlinear analog circuits by feature selection
Marek Ossowski · ICSES 2010 International Conference on Signals and Electronic Circuits · 2010
The strategy of feature extraction and selection enabling to improve efficiency of fault detection methods for analog nonlinear circuits is presented in the paper. Simple algorithm for data selection, ensuring the proper diagnosis of faulty circuits having limited number of testing points, under assumption, that complex signal processing tools are not available, is proposed and tested.