Absolute measurements of diffuse reflectance in the α°/d configuration
Dan Sheffer, Uri P. Oppenheim, Adam D. Devir · Applied Optics · 1991
An improved theory for data reduction of absolute reflectance measurements using the third Taylor method in the alpha degrees / d configuration is presented. A brief description is given of an absolute reflectometer operating in the 0.8-2.5-microm region. The reflectometer is operated according to the improved theory. Experimental data for some widely used samples are given, as well as data showing agreement between the current measurements and those made by the U.S. National Institute of Standards and Technology.