Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method
Francisco Alegría, António Cruz Serra · IEEE Transactions on Instrumentation and Measurement · 2008
Two of the parameters that are determined when testing an analog-to-digital converter (ADC) are the gain and offset errors. One of the ways to define these two parameters is called ldquoindependently based.rdquo In this paper, we derive the precision of the gain and offset errors estimated with the histogram test method affected by additive noise.