Research on ODC Based Software Defect Analysis Model
Qianran Si, Guo Ying Yan, Hui Ying Zhang · Advanced materials research · 2012
In this paper we discuss the fundamental principle of defect analysis, introduce the basic framework of Orthogonal Defect Classification（ODC）, and summarize the principle and features of defect analysis based on ODC. Using software defect metric, defect baseline and inference rules to do software process analysis, we propose a novel defect analysis model based on ODC. Combined with practical projects, the principle of this model is discussed in details, and this model can improve the objectivity and effectiveness of defect analysis, which is favorable for the automated defect analysis.