Hierarchical design and test of integrated microsystems
Tamal Mukherjee, Gary K. Fedder, Ronald DeShawn Blanton · IEEE Design & Test of Computers · 1999
This article presents emerging results of an integrated mixed-domain design methodology similar to the mixed-signal design methodologies in the VLSI community. This methodology is based on a hierarchical mixed-domain design representation and includes a Spice-like nodal simulation environment, an "on-the-fly" component layout-synthesis module, a layout extractor for design verification, and a fault model generator for test methodology development.