The method of determining the duration of transients in semiconductor devices for current-voltage characteristics measurement
Ievgen O. Iermolenko, Oleksandr Fedorovych Bondarenko, Kristina I. Iermolenko · 2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO) · 2013
The improved method of automatic determining the duration of oscillating transients in semiconductor devices for correct current-voltage characteristics measurement is proposed. This method allows increasing the accuracy of current-voltage characteristics measurement. It is applied in measuring device for current-voltage characteristics analysis.