Performance analysis for mobile‐relay‐based M2M two‐way AF relaying in N *Nakagami‐ m fading
Chonglin Zhang, Jianhua Ge, Jie Li, Yun Hu · Electronics Letters · 2013
The system outage probability of a mobile‐relay‐based two‐way amplify‐and‐forward (AF) relaying system is investigated. Independently but not necessarily identically distributed N *Nakagami‐ m fading is adopted to provide a realistic description of the mobile‐to‐mobile (M2M) channel. By slightly adjusting the integral region, concise and generalised closed‐form lower and upper bounds are obtained, providing valuable insight into practical system designs. Simulation results highlight the derived expressions and show that the lower bound can act as a tight closed‐form outage probability expression.