Resource-and-time-aware test strategy for configurable quaternary logic blocks
Érika Cota, Luigi Carro, Felipe Pinto, Ricardo A. L. Reis, Marcelo Soares Lubaszewski · 2009
The use of quaternary logic has been presented as a cost-effective solution to tackle the increasing area and power consumption of million-gate systems. This paper discusses the problem of testing a configurable logic block based on quaternary logic assuming a catastrophic fault model. We then analyze a possible test strategy in terms of number of test configurations and test vectors. Our preliminary results show that, for the most common faults, the resulting test cost for this new design paradigm can be very competitive.