VHDL implementation of BIST controller
S Jamuna, V.K. Agrawal · 2011
Built-in self-test (BIST) is a design technique that allows a circuit to test itself It is a set of structured-test techniques for combinational and sequential logic, memories, multipliers and other embedded logic blocks. The principle is to generate test vectors, apply them to the circuit under test or device under test, and then verify the response. Being an automated testing, BIST enables testing at high speed and high fault coverage. BIST controller coordinates the operations of different blocks of the BIST. Based on the test mode(TM) input to the controller, the system either operates in the normal mode or in the test mode. In this paper we explain an implementation of a restart able logic BIST controller for a combinational logic circuit using VHDL. It allows us to suspend the signature generation at any desired point in the test sequence. In this case, the BIST circuit is considered to comprise hold logic and a signature generation element. The hold logic will be implemented such that an external signal (HOED) can temporarily suspend signature generation in the signature generation element at specified times during the BIST session.