A comparison of statistical methods for evaluating matching performance of a biometric identification device: a preliminary report
Michael E. Schuckers, Anne Hawley, Katie Livingstone, Nona Mramba · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004
Confidence intervals are an important way to assess and estimate a parameter. In the case of biometric identification devices, several approaches to confidence intervals for an error rate have been proposed. Here we evaluate six of these methods. To complete this evaluation, we simulate data from a wide variety of parameter values. This data are simulated via a correlated binary distribution. We then determine how well these methods do at what they say they do: capturing the parameter inside the confidence interval. In addition, the average widths of the various confidence intervals are recorded for each set of parameters. The complete results of this simulation are presented graphically for easy comparison. We conclude by making a recommendation regarding which method performs best.