Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes
Fanyi Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, S. Pravossoudovitch, A. Virazel, Junxia Ma, Wei Zhao, Mark Mohammad Tehranipoor, Xiaoqing Wen · 2010
At-speed scan testing has become mandatory due to the extreme CMOS technology scaling. The two main at-speed scan testing schemes are namely Launch-Off-Shift (LOS) and Launch-Off-Capture (LOC). As it can be easily implemented, LOC has been widely investigated in the literature in the last few years, especially regarding test power consumption. Conversely, LOS has received much less attention. In this paper, we propose a comparison between the two testing schemes in terms of transition fault coverage and power consumption, in order to quantify the pros and cons of LOS with respect to LOC. This study shows that LOS not only exhibits higher performance in coverage but also does not require as much extra power as predicted, especially in terms of peak power. These facts may represent convincing arguments for its wider use and development.