A study on signature analyzer for design for test (DFT)
Abu Khari bin A'ain, Chee-How Lim, K. H. Ng, Sheng Kwang Ng, Liew Eng Yew · 2004
This paper takes a look at the use of linear feedback shift registers (LFSRs) as test pattern generators (TPGs) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.