Defect Oriented Testing for Analog/Mixed-Signal Designs
Bram Kruseman, Bratislav Tasić, Camelia Hora, Jos J. Dohmen, H. Hashempour, Maikel van Beurden, Yizi Xing · IEEE Design & Test of Computers · 2012
In this contribution, the authors describe an application of Defect Oriented Testing (DOT) to commercial mixed-signal designs. A major challenge of DOT application to these designs is the enormous simulation time typically required. The authors address this major challenge with a new algorithm that provides a significant speed-up of over 100x, while at the same time reduces test time by 48% and improves fault coverage by 15%.