Deductive fault simulation for sequential module circuits
Krzysztof Walczak · IEEE Transactions on Computers · 1988
A cost-effective method is presented for the deductive simulation of fault effects propagating through sequential functional modules that are described by the state-diagram representation of a Moore or Mealy automaton. The cornerstone of the method is a novel definition of the internal fault list of a sequential module. The method can be particularly useful for sequential modules when the state assignment and the gate-level realization are unknown.>