Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
Akito Monden, Satoshi Okahara, Yuki Manabe, Kenichi Matsumoto · IEEE Software · 2010
To increase productivity, programmers often unwittingly violate open source software licenses by reusing code fragments, or clones. The authors explore metrics that can reveal the existence or absence of code reuse and apply these metrics to 1,225 open source product pairs.