Ellipsoidal Tolerances Analysis Ensuring Product Yield Probability
Olexiy Voropay · 2007
A method of probabilistic tolerances analysis under normal distribution of input parameters and given product yield probability is offered. Output function deviations are found in points of its minimal and maximal values in bounds of tolerances domain, which approximated by multidimensional ellipsoid. Its size is selected proportionally to normalized normal inverse distribution.