On the application of equivocation for the extraction of features from imperfectly labeled patterns
C. CHITTI BABU · Proceedings of the IEEE · 1972
Upper and lower bounds on the equivocation I calculated from the probability density functions of perfectly labeled patterns are presented in terms of the equivocation I obtained from the probability density functions of imperfectly labeled patterns. Furthermore, it is shown that the minimization of I minimizes an upper bound on the probability of misrecognition.