On the Generation of Compact Deterministic Test Sets for BIST Ready Designs
Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht · 2013
In this work we consider ATPG methods tailored to BIST ready designs to improve compression of external tests for such designs. Proposed ATPG reduces external test set sizes and test data volumes by 24% in comparison to that obtained by a state of the art commercial ATPG for BIST ready designs.