Design-for-testability automation of mixed-signal integrated circuits
Sergey G. Mosin · 2013
The methodology to computer-aided design-for-testability (DFT) of mixed-signal IC is proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on the system analysis. The purpose and principal realization of the key DFT processes in the model are considered. The decision criterions of effective DFT-solution for particular mixed-signal circuit design are proposed. The features of testing circuitries library are descried. Experimental results of the methodology application for analog-digital ADPCM codec are presented.