Paramagnetic-center detection by SQUID measurement of static magnetic susceptibility
Aleksander I. Golovashkin, А. Л. Карузский, V. M. Mishachev, Alexander A. Orlikovsky, Vladimir V. Privezentsev, A. M. Tshovrebov · Russian Microelectronics · 2006
A method is proposed for counting small numbers of impurity paramagnetic centers in semiconductor specimens. It involves SQUID measurement of static magnetic susceptibility under resonant microwave saturation of the magnetic sublevels. The ultimate sensitivity of the method is calculated and compared with those of other approaches.