Computational diagnostics of electronic components
Alexander V. Goncharsky, A. N. Matvienko, D. O. Savin, A. V. Yasko · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1992
The great number of problems of computational diagnostics of electronic components can be formulated as tomographical problems with incomplete initial data. The standard methods of tomographical reconstruction can not be applied to solving problems of this kind. We have developed effective techniques for solving these problems on the basis of using some a priori information. We have used both information about compact support of distribution to be found and more hard a priori information--about laminar structure of the object under investigation. The obtained results demonstrate high efficiency of the developed techniques for computational diagnostics of electronic components.© (1992) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.