An optimal probe testing algorthm for the connectivity verification of MCM substrates
So-Zen Yao, Nan-Chi Chou, Chung‐Kuan Cheng, T. C. Hu · International Conference on Computer Aided Design · 1992
The k-probe testing methodology is an effec- tive approach to detect open and shod faults in MCM substrates. We propose an algorithm which generates the minimum number of tests for complete open fault cover- age. For k equals two, the algorithm is able to reduce the test size by up to 50% comparing with that generated by an ordinary approach. A multi-dimensional travel- ing salesman problem formulation is devised to optimize probe routes. The approach has been tested on existin.g substrate testers, and has achieved excellent results.