TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
Alejandro Czutro, Ilia Polian, Matthew Lewis, P. Engelke, Sudhakar M. Reddy, Bernd Becker · 2009
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully chosen mix of various optimization techniques, multi-million-gate industrial circuits are handled without aborts. TIGUAN supports both conventional single-stuck-at faults and sophisticated conditional multiple stuck-at faults which allows to generate patterns for non-standard fault models.