A Common Language Framework for Next-Generation Embedded Testing
Michele Portolan, Suresh Goyal, Bradford Van Treuren, Chen-Huan Chiang, T.J. Chakraborty, Thomas Cook · IEEE Design & Test of Computers · 2010
This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.