Automated system for the measurement of thermal impedance components of semiconductor devices
Д. И. Корунов, Vitaliy Ivanovich Smirnov · 2012
The article presents a system for measuring the components of the thermal impedance of semiconductor devices. The principle of operation is based on the heating device polyharmonic power, generated PWM and measures the response to this action - the variable component of the temperature, p-n junction.