Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model
F. Schuler, Georg Tempel, Hanno Melzner, Michael Jacob, Paul Hendrickx, Dirk Wellekens, Jan Van Houdt · Japanese Journal of Applied Physics · 2002
Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model, Schuler, Franz, Tempel, Georg, Melzner, Hanno, Jacob, Michael, Hendrickx, Paul, Wellekens, Dirk, Houdt, Jan Van