Special session 8B — Panel: In-field testing of SoC devices: Which solutions by which players?
Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, P.G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda · 2014
In-field testing of SoC devices is increasingly important to face the dependability requirements of several application domains. Different solutions can be devised and adopted. We summarize the main solutions currently adopted by industry, identify the most critical open issues, and discuss important future trends.