Parametric fault diagnosis for analog systems using functional mapping
Sasikumar Cherubal, Abhijit Chatterjee · 1999
We propose a new Simulation-After-Test (SAT) methodology for accurate diagnosis of circuit parameters in large analog circuits.Our methodology is based on constructing a non-linear regression model using prior circuit simulation, which relates a set of measurements to the circuit's internal parameters.First, we give algorithms to select measurements that give all the diagnostic information about the Circuit-Under-Test (CUT).From these selected measurements, we solve for the internal parameters of the circuit using iterative numerical techniques.The methodology has been applied to several mixed-signal test benchmark circuits and has applications in process debugging for mixed-signal integrated circuits (ICs) as well troubleshooting and repair of board level systems.