Nonlinearity Measurements Using Alternating Current
V. Ryšánek, Carlo E. Corsi, Arnaldo D’Amico · Active and Passive Electronic Components · 1978
The nonlinearity measurement technique described uses an adapted conventional lock‐in‐amplifier. This technique enables us to measure small nonlinearities over a wide frequency band and is more sensitive than the 1/f noise measurement used to detect non‐homogeneous structures in conductors, resistors and semiconductor components. Results illustrating uses of this method are presented for different types of resistor and semiconductor structures.