Design for manufacturability and yield
Andrzej J. Strojwas · 1989
This tutorial focuses on the design strategies for VLSI circuits that are aimed at achieving manufacturable, high-yielding chips. We review the current status of statistical design methodologies based upon statistically-valid modeling and process characterization approaches. Both parametric and functional yield maximization strategies are covered. This tutorial argues that by providing a better starting point for manufacturing, the profitability and competitiveness can be significantly improved.