Stuck-at-fault testing for quasi-delay-insensitive logic circuits
Arthit Thongtak, Takashi Nanya · Systems and Computers in Japan · 1998
In Quasi-Delay-Insensitive (QDI) circuits, some single stuck-at-faults may cause run-away transitions without stopping normal transitions. This paper clarifies problems in detecting such stuck-at-faults and proposes a method for generating test sequences for these problems. In this method, a test sequence is generated by searching for faulty excitation in a specified state transition series and by using a stable condition confirmed by an 8-value logic simulation. This paper also describes a method of using additional test terminals for control and observation signals specified in terms of the logic simulation to find otherwise undetectable faults. The effectiveness of the proposed method is experimentally confirmed by using a benchmark circuit. © 1998 Scripta Technica. Syst Comp Jpn, 29(2): 19–27, 1998