A method of analogue‐digital multiple fault diagnosis
David Reisig, Raymond A. DeCarlo · International Journal of Circuit Theory and Applications · 1987
Abstract This paper develops an algorithm for multiple fault diagnosis of analogue‐digital circuits. By sequentially partitioning the devices into those ‘assumed good’ and those ‘under test’, it is possible to develop a set of fault diagnosis equations which account for the special nature of digital components. A modified Newton‐Raphson solution is then described which incorporates a digital state hypothesis testing scheme in the solution of the fault diagnosis equations for each partition. After solving for the input‐output characteristics of the devices under test, a Boolean decision algorithm is used to analyse the test results of each partition and thus sequentially arrive at the set of faulty elements. A generic condition for diagnosability in terms of the circuit topology is given. Two examples are included to illustrate the technique.