Autoprobing on the L200 Functional Tester
Tim Moore, Stephen Garner · IEEE Design & Test of Computers · 1985
The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose production modules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasing the average diagnostic time, through automatic control of the probe's movement and positioning. The X-Y autoprobing systems installed have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.