Automated feature localization for hardware designs using coverage metrics
Jan Malburg, Alexander Finder, Görschwin Fey · 2012
Due to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction.