An efficient algorithm for the extraction of parameters with high confidence from nonlinear models
Charles F. Machala, Pratap Pattnaik, Ping Yang · IEEE Electron Device Letters · 1986
Analytical models with parameters numerically extracted from I-V data have been used in simulation of MOS circuits. The equations are quasi-physical and the extracted parameters do not normally relate to any single identifiable physical mechanism. We have developed an extraction system that can provide a measure of the level of confidence in the extracted parameters; hence, these parameters may be reliably used in circuit simulation as well as process control. The algorithm described is model independent and can be used for any nonlinear least-squares parameter extraction problem.