Gun life improvement program
John Atkinson, Thomas J. Grant, Brad Stockwell, B. Levush, Eric Nelson, John J. Petillo, Kenneth R. Eppley · 2004
The presentation describes work done under a Navy contract to reduce the life cycle cost of an S-band coupled cavity device. End of life of these devices was determined to be caused primarily by cathode wear-out. Consequently, the thrust of the program has been to re-design the electron gun for longer life.