Defect-oriented testing of mixed-signal ICs: some industrial experience
Yizi Xing · 2002
Some of Philips' industrial experience are presented in this paper on defect-oriented testing of mixed-signal ICs. Case studies on analog circuit blocks in two automotive mixed-signal ICs are described. This is done to demonstrate the potential of the defect-oriented testing approach in the industrial test development for test coverage improvement with simple industrial tests. It has been shown that, in addition to the conventional function-oriented tests, the test coverage of bridging faults can be significantly improved by some simple tests derived by using the defect-oriented testing approach.