GF(2/sup p/) cellular automata as a built in self test structure
Biplab Kumar Sikdar, Debesh Kumar Das, V. Boppana, C. Yang, S. Mukherjee, P.P. Chaudhuri · 2002
This paper presents an efficient BIST solution for VLSI circuit testing based on GF(2/sup p/) CA (cellular automata on an extended Galois field). The novel architecture of GF(2/sup p/) CA permits the BIST structure to be highly customized to the circuit under test (CUT). A methodology has been proposed to optimize the design of GF(2/sup p/) CA structure to maximize the fault coverage in a given CUT. In addition, an innovative scheme based on logic folding is presented to reduce the BIST overhead and make it more effective for large circuits.