Testing flash memories
Mohammad Mohammad, Kewal K. Saluja, Alex Yap · 2002
Flash memories can undergo three different types of disturbances, DC-programming, DC-erasure, and drain disturbance. These faults are specific to flash memories and do not occur in RAMs. In this paper, we discuss these disturbances, their causes, and develop fault models that capture the characteristics of these faults. We present optimal and near optimal algorithms to detect these faults in flash memories.