Design with testability for a platform-based SoC design methodology
Wuudiann Ke, Khoan Truong · AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360) · 2003
This paper describes a design-for-testability (DFT) methodology for an application-oriented platform-based design environment, which reuses test-ready virtual components (VCs) and integrates them using a set of predefined guidelines and practices. We focus on introducing the concept of the proposed methodology with examples for demonstrating some of the techniques and issues.