TEST: an effective automation tool for testing embedded software
Changhyun Baek, Seung-Kyu Park, Kyunghee Choi · Annual Conference on Computers · 2005
Much effort has been made to develop efficient tools for test automation of embedded software. To enhance higher level of test automation, so that errors are detected as early as possible, more comprehensive analytical measures should be taken to embedded systems. This paper presents a framework and implementation of an effective tool for test automation, in which Finite State Machine and Background Logic are adopted for modeling and the tool tests automatically analog and digital embedded systems. The tool aims to be more generic. The integrated tool, called TEST, is implemented to support all aspects occurring from modeling to test case generation. Applying TEST to actual applications shows a significant effectiveness in terms of finding errors and reducing time required to run the test.