The effects of test compaction on fault diagnosis
Y. Shao, Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy · 2003
The effect of test compaction on fault diagnosis is experimentally investigated. Results for combinational and sequential circuits indicate that the diagnostic resolution achieved by compacted tests is only minimally lower than that for uncompacted tests. Furthermore, the diagnostic resolution of the compacted tests can be enhanced to be the same or better than that for the uncompacted rests while still retaining compactness.