On-chip repair and an ATE independent fusing methodology
B. Cowan, O. Farnsworth, Peter Jul Jakobsen, S.F. Oakland, Michael R. Ouellette, D.L. Wheater · 2003
This paper describes a novel on chip repair system designed for ATE independent application on many unique very dense ASIC devices in a high turnover environment. During test, the system controls on chip built-in self-test (BIST) engines, collects and compresses repair data, programs fuses and finally decompresses and reloads the repair data for post fuse testing. In end use applications this system decompresses and loads the repair data at power-up or at the request of the system.