Concurrent testing of VLSI digital signal processors using mutation based testing
C. Aktouf, Ghassan Al-Hayek, Ch. Robach · 2002
This paper presents a new approach which allows VLSI digital signal processors (DSP) to be totally tested concurrently within useful computation. This approach uses a software technique called Mutation resting which has been successfully applied to hardware devices. Based on realistic examples of signal processing applications and state-of-the-art DSPs, the approach is shown highly efficient in terms of fault coverage and fault latency.