A versatile built-in self test scheme for delay fault testing
Yiorgos E. Tsiatouhas, Th. Haniotakis, Dimitrios Nikolos, A. Arapoyanni · Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) · 2002
Summary form only given. A new Built-in Self Test (BIST) scheme is presented that can be used for both off-line production or periodic testing of delay faults as well as for concurrent detection of faults causing signal delays in the field. The scheme is based on the I/sub DDT/ monitoring of the outputs of the circuit under test (CUT). The proposed scheme has minimal impact on the performance and silicon area of the design since the same response verifier circuit is used for both off-line and concurrent detection of errors in the field.