Fault diagnosis in scan-based BIST
Janusz Rajski, Jerzy Tyszer · 2002
The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective of the error multiplicity. The proposed scheme employs a simple scan cell selection hardware which in conjunction with a conventional signature analysis allows flexible tradeoffs between the test application time and the diagnostic resolution.