Built-in high resolution signal generator for testing ADC and DAC
Yeong-Jar Chang, Soon-Jyh Chang, J.Hui Hui Ho, Chee-Kian Ong, Ting Cheng, Wen-Ching Wu · 2004
This paper presents a design of the built-in high resolution signal generator for testing analog-to-digital converter (ADC) and digital-to-analog converter (DAC). The sigma-delta demodulator scheme is used in the design to generate on-chip high accurate stimulus. We discuss the issues on the generation of all the required stimuli using the same circuitry and other issues on implementing this scheme. Our signal generator can be applied to test the embedded 13-bit ADC and DAC in asymmetry digital subscriber line system on a chip (ADSL SoC).