Fast static compaction of tests composed of independent sequences: basic properties and comparison of methods
Jaan Raik, Artur Jutman, Raimund Ubar · 2003
This paper presents an overview of recently proposed fast methods for static compaction of sequential circuit tests divided into independent test sequences. The methods include genetic algorithm based, greedy and deterministic approaches. We explain the algorithms and discuss the underlying complexity issues. The different methods were tested on a large number of publicly available benchmark test sets in order to assess their efficiency. In addition to the comparison of approaches, our experiments reveal some remarkable properties of realistic sequential circuit test sets.