Pal and logic array in-circuit testing considerations
Robert G. Jacobson · International Test Conference · 1984
PALs (R), logic arrays, and gate arrays mounted on circuit boards present unique testing problems for the in-circuit tester such as oscillations when back-driving, initialization problems, and increased test development time. Some techniques to alleviate these problems are presented, including design for testability, suggestions for test programming, and features to look for in a test system.